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Stress-induced Degradations and Self-heating Effects in P-channel Power VDMOS Transistors

XVII International Conference on Systems, Automatic Control and Measurements, SAUM 2024 (pp. 125-128) АУТОР(И) / AUTHOR(S): Sandra Veljković , Nikola Mitrović , Miloš Marjanović , Emilija Živanović , Vojkan Davidović , Goran Ristić , Danijel Danković  Download Full Pdf   DOI:  10.46793 САЖЕТАК / ABSTRACT: This study investigates…

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